| KLA Corporation |
| Offers wide-ranging solutions for process control and yield management. |
Develops advanced inspection tools for semiconductor manufacturing processes. |
Extensive portfolio supporting various semiconductor manufacturing processes. |
Investments in AI and machine learning enhance automated inspection capabilities. |
| Applied Materials Inc. |
| Delivers advanced materials engineering solutions for chip manufacturing. |
Provides equipment used in the fabrication and measurement of semiconductor devices. |
Innovative technologies enhancing yields and reducing production costs. |
Expanding portfolio to cover advanced packaging solutions and process control. |
| Onto Innovation Inc. |
| Specializes in metrology and inspection technologies for semiconductor processes. |
Offers solutions focused on improving yield and efficiency in semiconductor production. |
Focus on advanced inspection tools for leading-edge semiconductor nodes. |
Focus on integrating metrology data with manufacturing workflows for analytics. |
| Thermo Fisher Scientific Inc. |
| Provides comprehensive analytical technologies aimed at semiconductor inspection. |
Delivers high precision instruments for semiconductor inspection and metrology. |
Strong reputation in scientific instrumentation for diverse applications. |
Diversification into materials characterization to support various industries. |
| Hitachi Hi-Technologies Corporation (Hitachi Limited) |
| Integrates high-precision measurement solutions in semiconductor manufacturing. |
Utilizes cutting-edge technology to enhance semiconductor manufacturing inspection capabilities. |
Diverse product line catering to various metrology and inspection needs. |
Leveraging existing technology for cross-industry applications and collaborations. |